O annealing on tungsten nanocrystal with W/Si dual-sputtered method for nonvolatile memory application.
Jer-Chyi WangPai-Chi ChouChao-Sung LaiWen-Hui LeeChi-Fong AiPublished in: Microelectron. Reliab. (2010)
Keyphrases
- high accuracy
- significant improvement
- high precision
- preprocessing
- experimental evaluation
- modeling method
- computationally efficient
- mutual information
- classification accuracy
- computational complexity
- objective function
- dynamic programming
- cost function
- input data
- energy function
- classification method
- image processing
- memory requirements
- memory usage
- neural network