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Visual wafer dies counting using geometrical characteristics.

Shaoqiu XuZhihang ChengYang GaoQing Pan
Published in: IET Image Process. (2014)
Keyphrases
  • real time
  • visual cues
  • semiconductor manufacturing
  • real world
  • knowledge base
  • image sequences
  • multi agent systems
  • evolutionary algorithm
  • low level
  • multi modal
  • integrated circuit
  • visual perception
  • visual tasks