Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data.
Qiuhao XuChuqiao XuJunliang WangPublished in: Auton. Intell. Syst. (2022)
Keyphrases
- high dimensional data
- high dimensional
- feature selection
- dimensionality reduction
- high dimensionality
- genetic algorithm
- low dimensional
- data distribution
- feature space
- high dimension
- support vector
- dimension reduction
- nearest neighbor
- gene expression data
- small sample
- similarity search
- high dimensions
- data points
- subspace clustering
- support vector machine svm
- knn
- small sample size
- input space
- support vector machine
- high dimensional datasets
- text categorization
- kernel function
- selected features
- lower dimensional
- data sets
- high dimensional spaces
- data analysis
- linear discriminant analysis
- microarray data
- clustering high dimensional data
- dimensional data
- model selection
- feature set
- manifold learning
- variable selection
- high dimensional feature spaces
- neural network
- hyperplane
- machine learning
- euclidean distance
- svm classifier
- locally linear embedding
- pattern recognition
- feature extraction
- high dimensional data sets
- computer vision
- text data
- feature selection algorithms
- feature subset
- particle swarm optimization
- multi dimensional
- feature vectors
- training data