Login / Signup

Efficient Techniques for Noise Characterization of Sequential Cells and Macros.

Venkat Rao VallapenaniRavi Shankar ChevuriBingxiong XuLun YeKanad Chakraborty
Published in: VLSI Design (2006)
Keyphrases
  • artificial intelligence
  • noisy data
  • cost effective
  • signal to noise ratio
  • image noise
  • machine learning
  • multiresolution
  • image registration
  • computationally expensive
  • additive noise
  • random noise