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Efficient Techniques for Noise Characterization of Sequential Cells and Macros.
Venkat Rao Vallapenani
Ravi Shankar Chevuri
Bingxiong Xu
Lun Ye
Kanad Chakraborty
Published in:
VLSI Design (2006)
Keyphrases
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artificial intelligence
noisy data
cost effective
signal to noise ratio
image noise
machine learning
multiresolution
image registration
computationally expensive
additive noise
random noise