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Using neural networks to detect the bivariate process variance shifts pattern.

Chuen-Sheng ChengHui-Ping Cheng
Published in: Comput. Ind. Eng. (2011)
Keyphrases
  • neural network
  • pattern recognition
  • artificial neural networks
  • database
  • real world
  • fuzzy logic
  • pattern matching
  • process model
  • image processing
  • automatic detection