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CMOS Transconductor Analysis for Low Temperature Sensitivity Based on ZTC MOSFET Condition.

Pedro ToledoHamilton KlimachDavid CordovaSergio BampiEric E. Fabris
Published in: SBCCI (2015)
Keyphrases
  • three dimensional
  • database
  • image processing
  • low cost
  • sufficient conditions
  • statistical analysis
  • sensitivity analysis