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Comparing different solutions for testing resistive defects in low-power SRAMs.
Nunzio Mirabella
Michelangelo Grosso
Giovanna Franchino
Salvatore Rinaudo
Ioannis Deretzis
Antonino La Magna
Matteo Sonza Reorda
Published in:
CoRR (2021)
Keyphrases
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low power
power consumption
low cost
high speed
single chip
vlsi architecture
low power consumption
digital signal processing
high power
vlsi circuits
logic circuits
mixed signal
real time
image sensor
power reduction
cmos technology
wireless transmission