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Bayesian model calibration for diblock copolymer thin film self-assembly using power spectrum of microscopy data.

Lianghao CaoKeyi WuJ. Tinsley OdenPeng ChenOmar Ghattas
Published in: CoRR (2023)
Keyphrases
  • bayesian model
  • data analysis
  • em algorithm
  • thin film
  • power spectrum
  • high quality
  • feature extraction
  • knowledge discovery
  • semi supervised
  • natural images