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Deep learning for virtual metrology: Modeling with optical emission spectroscopy data.

Matteo TerziChiara MasieroAlessandro BeghiMarco MaggipintoGian Antonio Susto
Published in: RTSI (2017)
Keyphrases
  • deep learning
  • data sets
  • training data
  • data analysis
  • knowledge discovery
  • information retrieval
  • face recognition
  • viewpoint