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Investigation of the shift of hot spot in lateral diffused LDMOS under ESD conditions.

Qinsong QianWeifeng SunJing ZhuLongxing Shi
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • hot spots
  • sufficient conditions
  • spatial analysis
  • point processes
  • data sets
  • databases
  • machine learning methods