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Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan.

S. NakajimaS. NakamuraK. KujiT. UekiT. AjiokaT. Sakai
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • cost effective
  • low cost
  • image analysis
  • long term
  • management system