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Capacitance model of submicron MESFET under illumination.

B. K. MishraLochan Jolly
Published in: ICWET (2010)
Keyphrases
  • high level
  • computational model
  • statistical model
  • em algorithm
  • data sets
  • viewpoint
  • probability distribution
  • high speed
  • parameter estimation
  • formal model
  • vlsi circuits