Login / Signup

Optimizing Scan Times of BLE Scanning Systems.

John N. DaigleGeorge HumphreyHenry C. LenaAvijit Sarker
Published in: ICCCN (2020)
Keyphrases
  • expert systems
  • scan data
  • distributed systems
  • management system
  • computer systems
  • machine learning
  • computer vision
  • multiscale
  • knowledge based systems
  • retrieval systems