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Comments on "Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry".

Claudio De LucaFrancesco CasuMichele ManuntaGiovanni OnoratoRiccardo Lanari
Published in: IEEE Trans. Geosci. Remote. Sens. (2022)
Keyphrases
  • empirical studies
  • multiresolution
  • image registration
  • statistical analysis
  • qualitative and quantitative
  • object shape