Realities and Challenges of III-V/Si Integration Technologies.
John E. BowersDuanni HuangDaehwan JungJustin NormanMinh A. TranYating WanWeiqiang XieZeyu ZhangPublished in: OFC (2019)
Keyphrases
- technical solutions
- lessons learned
- ubiquitous and pervasive
- future trends
- real world
- practical experiences
- academic community
- open issues
- data mining
- key technologies
- activity monitoring
- computing infrastructure
- enterprise search
- data fusion
- design principles
- emerging technologies
- technical challenges
- technical issues
- paradigm shift
- information technology
- development efforts
- technological solutions
- information systems
- st century
- web intelligence
- heterogeneous platforms
- data sets