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Fault-Tolerant Control and Isolation Method for NPC-Based AFEC Using Series-Connected 10kV SiC MOSFETs.

Semih IsikSanket ParasharSubhashish Bhattacharya
Published in: IEEE Access (2022)
Keyphrases
  • significant improvement
  • detection method
  • error rate
  • artificial intelligence
  • clustering method
  • similarity measure
  • dynamic programming
  • least squares
  • mathematical model
  • path planning
  • manufacturing systems