Login / Signup

Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines.

Khitem LahbachaGiulia Di CapuaGianfranco MieleAntonio MaffucciAndrea Gaetano ChiarielloThi Dao PhamDjamel Allal
Published in: M&N (2024)
Keyphrases
  • thin film
  • signal processing
  • short circuit
  • neural network