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Exploring TanDEM-X Interferometric Products for Crop-Type Mapping.

Mario BusquierJuan M. Lopez-SanchezAlejandro Mestre-QueredaElena NavarroMaria P. González-DugoLuciano Mateos
Published in: Remote. Sens. (2020)
Keyphrases
  • artificial intelligence
  • fourier transform
  • product information