A New Method for RTS Noise of Semiconductor Devices Identification.

Alicja Konczakowska Jacek Cichosz Arkadiusz Szewczyk

Published in: IEEE Trans. Instrum. Meas. (2008)

Keyphrases

detection method
preprocessing
high accuracy
cost function
missing data
objective function
pairwise
significant improvement
input data
noisy data
similarity measure
multiscale
segmentation method
noise reduction
noise immunity