Classification From Positive and Biased Negative Data With Skewed Labeled Posterior Probability.

Shotaro Watanabe Hidetoshi Matsui

Published in: Neural Comput. (2023)

Keyphrases

high quality
data sets
training data
prior knowledge
class membership
knowledge discovery
small number
posterior probability
image processing
feature extraction
pattern recognition
training set
machine learning methods
highly skewed
positive and negative
probabilistic model
feature selection