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Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination.

Jae-Seong JeongYoung Jeon Kim
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • real time
  • neural network
  • highly reliable
  • multi touch
  • real world
  • artificial intelligence
  • case study
  • high resolution
  • line drawings
  • display devices
  • failure prediction