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Statistical Functional Yield Estimation and Enhancement of CNFET-Based VLSI Circuits.
Behnam Ghavami
Mohsen Raji
Hossein Pedram
Massoud Pedram
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
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vlsi circuits
low power
statistically sound
image processing
statistical analysis
image enhancement
parameter estimation
case study
multi view
contrast enhancement