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An accurate electro-thermal model for merged SiC PiN Schottky diodes.
Mariusz Zubert
Lukasz Starzak
Grzegorz Jablonski
Malgorzata Napieralska
Marcin Janicki
Tomasz Pozniak
Andrzej Napieralski
Published in:
Microelectron. J. (2012)
Keyphrases
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mathematical model
computational model
prior knowledge
conceptual model
probability distribution
probabilistic model
statistical model
database
sensitivity analysis
formal model
input data
em algorithm
process model
hidden markov models
experimental data
neural network model
highly accurate
autoregressive