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Replica Tracked Post Silicon Trimming Enabled Negative Bit Line Voltage Based Write Assist Scheme in SRAM Design.

Ankur GoelRajender K. SharmaAnil K. Gupta
Published in: J. Low Power Electron. (2015)
Keyphrases
  • real time
  • positive and negative
  • image sequences
  • load balancing
  • power consumption
  • protection scheme