A simple built-in current sensor for IDDQ testing of CMOS data converters.
Ashok K. SrivastavaSrinivas Rao AluriAnand Kumar ChamakuraPublished in: Integr. (2005)
Keyphrases
- data collection
- synthetic data
- data sets
- data quality
- sensor data
- knowledge discovery
- data processing
- database
- correlation analysis
- prior knowledge
- data sources
- data acquisition
- multiple sensors
- raw data
- missing data
- high dimensional data
- statistical analysis
- computer systems
- low cost
- data points
- data analysis
- high quality