A Boosting Regression-Based Method to Evaluate the Vital Essence in Semiconductor Industry Performance.
Pingyu HsuI-Wen YehChing-Hsun TsengShin-Jye LeePublished in: IEEE Access (2020)
Keyphrases
- computationally efficient
- cost function
- preprocessing
- optimization algorithm
- high accuracy
- computational complexity
- classification method
- dynamic programming
- significant improvement
- pairwise
- clustering method
- detection method
- error rate
- high precision
- computational cost
- probabilistic model
- classification accuracy
- input data
- synthetic data
- feature extraction
- machine learning methods