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An Area Efficient Built-in Phase Testing Equipment for Phased Array Front-End ICs.

Adam WaksOlivier CrandOlivier TessonThierry TarisJean-Baptiste Bégueret
Published in: ISCAS (2023)
Keyphrases
  • phased array
  • cost effective
  • high quality
  • single image
  • feature extraction
  • spatial domain
  • scan data