Semantic Segmentation-Based Wafer Map Mixed-Type Defect Pattern Recognition.
Jinda YanYi ShengMinghao PiaoPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
- semantic segmentation
- pattern recognition
- street scenes
- weakly supervised
- label transfer
- superpixels
- object categories
- conditional random fields
- computer vision
- image processing
- object detection
- scene classification
- feature extraction
- pascal voc
- machine learning
- image understanding
- probabilistic model
- long range
- multiscale
- feature selection