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A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect.
Javier Vales-Alonso
Juan Pedro Muñoz-Gea
Juan J. Alcaraz
Published in:
EURFID (2015)
Keyphrases
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simulation study
theoretical framework
study proposes
neural network
process model
metamodel
high level
computational model
experimental data
markov chain
theoretical foundation
prior knowledge
lightweight
data collection
probabilistic model
optimization process
diffusion process