Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection.
Yinan N. ShenFabrizio LombardiPublished in: J. Electron. Test. (1990)
Keyphrases
- object detection
- response time
- automatic detection
- detection algorithm
- detection method
- decision making
- image enhancement
- manufacturing processes
- false alarms
- manufacturing systems
- detection rate
- false positives
- digital images
- object recognition
- decision trees
- data mining
- neural network
- detection accuracy
- production planning
- real time