A novel method for signal labeling and precise location in a variable parameter milling process based on the stacked-BiLSTM-CRF and FLOSS.
Chaochao QiuKai LiXinzhao ZhouSongping HeBin LiPublished in: Adv. Eng. Informatics (2023)
Keyphrases
- pairwise
- high accuracy
- detection method
- dynamic programming
- wavelet analysis
- signal processing
- probabilistic model
- cost function
- significant improvement
- preprocessing
- computational complexity
- objective function
- prior knowledge
- high speed
- clustering method
- similarity measure
- segmentation method
- process model
- development process
- linear model
- parameter learning
- image segmentation