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Local Fading Memory Effects in a Tantalum Oxide ReRAM Cell from Hewlett Packard Labs.

Alon AscoliNicolas SchmittIoannis MessarisAhmet Samil DemirkolRonald TetzlaffJohn Paul StrachanLeon O. Chua
Published in: MetroXRAINE (2023)
Keyphrases
  • hewlett packard
  • main memory
  • neural network
  • limited memory
  • fuel cell
  • database
  • real time
  • signal to noise ratio
  • computational power
  • memory management