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Handloom Silk Fabric Defect Detection Using First Order Statistical Features on a NIOS II Processor.

M. E. ParamasivamR. S. Sabeenian
Published in: ICT (2010)
Keyphrases
  • real time
  • image features
  • feature extraction
  • feature vectors
  • low level
  • feature space
  • higher order
  • high speed
  • feature set
  • first order logic
  • parallel processing
  • statistical information