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New Latch-Up Model for Deep Sub-micron Integrated Circuits.

Pan DongLong FanSuge YueHongchao ZhengShougang Du
Published in: DASC (2011)
Keyphrases
  • integrated circuit
  • mathematical model
  • computational model
  • high level
  • machine learning
  • prior knowledge
  • management system
  • statistical model
  • database
  • data sets
  • markov random field
  • prediction model