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Intelligent Defect Identification Based on PECT Signals and an Optimized Two-Dimensional Deep Convolutional Network.

Baoling LiuJun HeXiaocui YuanHuiling HuXuan ZengZhifang ZhuJie Peng
Published in: Complex. (2020)
Keyphrases
  • convolutional network
  • convolutional neural networks
  • three dimensional
  • facial landmark localization
  • image processing
  • multi class
  • probability density function
  • coarse to fine