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Average-Case Optimized Transistor-Level Technology Mapping of Extended Burst-Mode Circuits.

Kevin W. JamesKenneth Y. Yun
Published in: ASYNC (1998)
Keyphrases
  • average case
  • high speed
  • worst case
  • worst case analysis
  • uniform distribution
  • learning curves
  • circuit design
  • power dissipation
  • cmos technology
  • upper bound
  • data sets
  • low power
  • vc dimension