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Exit Wavefunction Reconstruction from Single Transmisson Electron Micrographs with Deep Learning.
Jeffrey M. Ede
Jonathan J. P. Peters
Jeremy Sloan
Richard Beanland
Published in:
CoRR (2020)
Keyphrases
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deep learning
electron micrographs
unsupervised learning
machine learning
unsupervised feature learning
three dimensional
training set
supervised learning
deep architectures
data mining
learning algorithm
model selection