Tolerance analysis for electronic circuit design using the method of moments.
Wei SunRichard M. M. ChenYao-Lin JiangPublished in: ISCAS (1) (2002)
Keyphrases
- significant improvement
- cost function
- experimental evaluation
- high precision
- pairwise
- image analysis
- support vector machine svm
- computational cost
- circuit design
- classification method
- synthetic data
- high accuracy
- support vector machine
- data analysis
- prior knowledge
- multiresolution
- preprocessing
- support vector
- high order
- objective function