Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement.
Md. Rafiqul IslamMorshed U. ChowdhuryPublished in: CAINE (2002)
Keyphrases
- dynamic programming
- learning algorithm
- cost function
- optimal solution
- preprocessing
- matching algorithm
- optimization algorithm
- objective function
- convergence rate
- product line
- similarity measure
- segmentation algorithm
- particle swarm optimization
- worst case
- computational cost
- machine learning
- decision trees
- search space
- computational complexity
- experimental evaluation
- high accuracy
- np hard
- expectation maximization
- query processing
- detection algorithm
- error rate
- k means