High Accuracy Profile Measurement With a New Virtual Multi-Probe Scanning System.
Ning ChaiZiqiang YinJianhua YaoPublished in: IEEE Access (2020)
Keyphrases
- high accuracy
- augmented reality
- virtual environment
- high efficiency
- highly accurate
- image processing
- virtual world
- user profiles
- added advantage
- virtual reality
- machine learning
- input image
- scan data
- artificial neural networks
- multiscale
- decision trees
- web services
- knowledge base
- decision making
- feature selection
- genetic algorithm