Login / Signup
Computational analysis of counter-based schemes for VLSI test pattern generation.
Dimitrios Kagaris
Spyros Tragoudas
Published in:
Discret. Appl. Math. (2001)
Keyphrases
</>
neural network
feature extraction
multiscale
machine learning
computer vision
data analysis
statistical analysis
real time
data sets
data mining
artificial intelligence
multimedia
wide range
image analysis