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A Baseline Accuracy Classification Method to Over-come the Over-Fitting Problem for Class- Imbalanced Defect-Prone Datasets Model.

Salahuddin ShaikhChangan LiuMaaz Rasheed Malik
Published in: SysCon (2020)
Keyphrases
  • classification method
  • image processing
  • knn
  • support vector machine
  • classification algorithm
  • class imbalanced
  • learning algorithm
  • multi class