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A Baseline Accuracy Classification Method to Over-come the Over-Fitting Problem for Class- Imbalanced Defect-Prone Datasets Model.
Salahuddin Shaikh
Changan Liu
Maaz Rasheed Malik
Published in:
SysCon (2020)
Keyphrases
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classification method
image processing
knn
support vector machine
classification algorithm
class imbalanced
learning algorithm
multi class