Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan.
Mitsuo TeramotoTomoo FukazawaPublished in: ITC (1996)
Keyphrases
- delay insensitive
- high level synthesis
- asynchronous circuits
- shift register
- signal processing
- high speed
- input signals
- circuit design
- acoustic signals
- independent component analysis
- data sets
- ecg signals
- discussion forums
- real time
- radio frequency
- empirical mode decomposition
- audio signals
- analog circuits
- eeg signals
- logic circuits
- low power
- multiscale
- decision trees