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with gauge measurement errors.

Wen Lea PearnMou-Yuan Liao
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • measurement errors
  • measurement error
  • registration errors
  • projective transformations
  • gray value
  • viewpoint
  • three dimensional
  • high quality
  • input image
  • co occurrence
  • vision system
  • sample points