A concurrent pattern operation algorithm for VLSI mask data.
Akira TsukizoeTokinori KozawaJun'ya SakemiChihei MiuraTatsuki IshiiPublished in: Systems and Computers in Japan (1987)
Keyphrases
- input data
- detection algorithm
- data sets
- data analysis
- preprocessing
- search space
- cost function
- learning algorithm
- similarity measure
- expectation maximization
- noisy data
- original data
- optimization algorithm
- prior information
- particle swarm optimization
- incomplete data
- computational cost
- k means
- data points
- dynamic programming
- dimensional data
- database
- recognition algorithm
- information loss
- data reduction
- single scan
- missing data
- synthetic data
- data collection
- data mining techniques
- image data
- data sources
- computational complexity
- data structure
- high quality
- training data