Developing a Deep Learning-Based Affect Recognition System for Young Children.
Amir Hossein FarzanehYanghee KimMengxi ZhouXiaojun QiPublished in: AIED (2) (2019)
Keyphrases
- deep learning
- young children
- unsupervised learning
- early years
- unsupervised feature learning
- machine learning
- deep architectures
- children learn
- primary school
- mental models
- weakly supervised
- viewpoint
- data sets
- restricted boltzmann machine
- data mining
- text classification
- draw conclusions
- probabilistic model
- feature extraction