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A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory.

Dongjin LeeYunjo LeeSoyeong NaKangOh YunSungkweon BaekJaeduk LeeJaehoon JangJaihyuk Song
Published in: IRPS (2024)
Keyphrases
  • neural network
  • embedded systems
  • flash memory
  • real time
  • data mining
  • high level
  • database systems