Testing of Microprocessor Devices on the Basis of Artificial Neural Networks with Changeable parameters.
Viktor LokazyukViktor CheshunVitaliy ChornenkiyPublished in: Int. J. Comput. (2004)
Keyphrases
- artificial neural networks
- neural network
- high speed
- using artificial neural networks
- maximum likelihood
- parameter estimation
- back propagation
- mobile devices
- design methodology
- computational intelligence
- input variables
- sensitivity analysis
- feed forward neural networks
- real time
- parameter values
- neural network model
- fuzzy logic
- machine learning
- feed forward
- fuzzy rules
- input parameters
- data sets