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A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits.

Ingrid KovacsMarina Dana TopaMonica EneAndi BuzoGeorg Pelz
Published in: DCIS (2020)
Keyphrases
  • integrated circuit
  • metamodel
  • adaptive sampling
  • modeling language
  • life cycle
  • model driven
  • uml profile
  • data model
  • black box
  • development process
  • random sampling
  • platform independent
  • case study
  • software systems