Comparing different solutions for testing resistive defects in low-power SRAMs.
Nunzio MirabellaMichelangelo GrossoGiovanna FranchinoSalvatore RinaudoIoannis DeretzisAntonino La MagnaMatteo Sonza ReordaPublished in: LATS (2021)
Keyphrases
- low power
- power consumption
- low cost
- high speed
- single chip
- logic circuits
- wireless transmission
- low power consumption
- high power
- digital signal processing
- vlsi circuits
- gate array
- power dissipation
- power reduction
- vlsi architecture
- image quality
- real time
- ultra low power
- cmos technology
- image sensor
- digital camera
- signal processing
- general purpose